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56082 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 129016 |
|
Oxford Plasmalab 800 Plus RIE |
Oxford | Plasmalab 800 Plus | RIE | - |
| 129004 |
|
FSI Mercury MP Batch Wafer Processing |
FSI | Mercury MP | Batch Wafer Processing | 8 inch |
| 129007 |
|
Camtek Falcon 630 Automatic Wafer Optical Inspection System |
Camtek | Falcon 630 | Automatic Wafer Optical Inspection System | - |
| 129003 |
|
FSI Mercury MP Batch Wafer Processing |
FSI | Mercury MP | Batch Wafer Processing | 8 inch |
| 129006 |
|
KLA-Tencor Surfscan 6220 Inspection System |
KLA-Tencor | Surfscan 6220 | Inspection System | 8 inch |
| 129000 |
|
Zeiss LSM 880 Confocal Microscope |
Zeiss | LSM 880 | Confocal Microscope | - |
| 128994 |
|
Tel P 12 XL Wafer Prober |
Tel | P 12 XL | Wafer Prober | - |
| 128990 |
|
Hitachi S 8820 CD-SEM |
Hitachi | S 8820 | CD-SEM | - |
| 128985 |
|
Hitachi S 8820 CD-SEM |
Hitachi | S 8820 | CD-SEM | - |
| 127578 |
|
Zygo Mark III Interferometer |
Zygo | Mark III | Interferometer | - |
| 128960 |
|
Aixtron IC 2 G 5 SiC Epitaxy Reactor |
Aixtron | IC 2 G 5 | SiC Epitaxy Reactor | - |
| 128955 |
|
Leybold D 65 BCS Vacuum Pump |
Leybold | D 65 BCS | Vacuum Pump | - |
| 128953 |
|
Hitachi HD 2700 STEM |
Hitachi | HD 2700 | STEM | - |
| 128942 |
|
Chapman MP 2000 + Surface Profiler |
Chapman | MP 2000 + | Surface Profiler | - |
| 128940 |
|
Takaya APT 9411 SL Flying Probe |
Takaya | APT 9411 SL | Flying Probe | - |
| 128939 |
|
K&S IConn Plus Wire Bonder |
K&S | IConn Plus | Wire Bonder | - |
| 128937 |
|
Finetech Fineplacer Lambda Sub Micron Die Bonder |
Finetech | Fineplacer Lambda | Sub Micron Die Bonder | - |
| 128938 |
|
Atlas Copco ZT 37 Air Compressor |
Atlas Copco | ZT 37 | Air Compressor | - |
| 128924 |
|
Tel Alpha 8 S D Wafer Processing Diffusion Furnace |
Tel | Alpha 8 S D | Wafer Processing Diffusion Furnace | 8 inch |
| 128923 |
|
Tel A 8 Batch Thermal Processing System |
Tel | A 8 | Batch Thermal Processing System | - |
| 128922 |
|
Tel Alpha 8 S D Thermal Processing Furnace |
Tel | Alpha 8 S D | Thermal Processing Furnace | 8 inch |
| 128921 |
|
Tel Alpha 8 S Z LPCVD |
Tel | Alpha 8 S Z | LPCVD | - |
| 128920 |
|
Kokusai DD 853 V Vertical Diffusion Furnace |
Kokusai | DD 853 V | Vertical Diffusion Furnace | 8 inch |
| 128919 |
|
KLA-Tencor AIT II Defect Inspection System |
KLA-Tencor | AIT II | Defect Inspection System | 8 inch |
| 128917 |
|
Nanometrics / Bio-Rad / Accent QS 2200 A Parts |
Nanometrics / Bio-Rad / Accent | QS 2200 A | Parts | - |
| 128898 |
|
FEI NanoLab 450 F 1 Dual Beam FIB-SEM |
FEI | NanoLab 450 F 1 | Dual Beam FIB-SEM | - |
| 128895 |
|
Hitachi SFT 9300 XRF Coating Thickness Gauge |
Hitachi | SFT 9300 | XRF Coating Thickness Gauge | - |
| 128894 |
|
Hitachi FT 9450 XRF Coating Thickness Gauge |
Hitachi | FT 9450 | XRF Coating Thickness Gauge | - |
| 128892 |
|
Advantest / Verigy V 93000 C (2 CC) DUT Test Head |
Advantest / Verigy | V 93000 C (2 CC) | DUT Test Head | - |
| 128890 |
|
Advantest / Verigy V 93000 C (2 CC) DUT Test Head |
Advantest / Verigy | V 93000 C (2 CC) | DUT Test Head | - |
| 128889 |
|
Advantest / Verigy V 93000 C (2 CC) DUT Test Head |
Advantest / Verigy | V 93000 C (2 CC) | DUT Test Head | - |
| 128885 |
|
Advantest / Verigy V 93000 C (2 CC) DUT Test Head |
Advantest / Verigy | V 93000 C (2 CC) | DUT Test Head | - |
| 128880 |
|
Disco DGP 8761 + DFM 2800 Grinder / Polisher |
Disco | DGP 8761 + DFM 2800 | Grinder / Polisher | - |
| 128876 |
|
Teradyne UltraFlex Epsilon Boards |
Teradyne | UltraFlex Epsilon | Boards | - |
| 128862 |
|
Oxford NordlysMax 2 EBSD Detector |
Oxford | NordlysMax 2 | EBSD Detector | - |
| 128860 |
|
Sutter P 97 Flaming Micropipette Puller |
Sutter | P 97 | Flaming Micropipette Puller | - |
| 128858 |
|
Bruker D 8 Venture X-ray Diffraction (XRD) |
Bruker | D 8 Venture | X-ray Diffraction (XRD) | - |
| 128857 |
|
Bruker Avance III HD+ Ascend 600 NMR Spectrometer |
Bruker | Avance III HD+ Ascend 600 | NMR Spectrometer | - |
| 128854 |
|
KLA-Tencor Candela 8620 Wafer Inspection System |
KLA-Tencor | Candela 8620 | Wafer Inspection System | - |
| 128849 |
|
Zeiss LSM 880 |
Zeiss | LSM 880 | - | - |
| 128842 |
|
Accretech / TSK AP 3000 Wafer Prober |
Accretech / TSK | AP 3000 | Wafer Prober | - |
| 128840 |
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128839 |
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128838 |
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128841 |
|
Accretech / TSK UF 3000 EX Wafer Prober |
Accretech / TSK | UF 3000 EX | Wafer Prober | - |
| 128837 |
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128836 |
|
Hesse & Knipps (H&K) BJ 820 Wire Bonder |
Hesse & Knipps (H&K) | BJ 820 | Wire Bonder | - |
| 128831 |
|
Shishincron RAS 1100 C Radical Assisted Sputtering |
Shishincron | RAS 1100 C | Radical Assisted Sputtering | - |