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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
56148 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 289 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 290 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 291 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 292 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 293 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 294 |
|
Blue M DCC 1406 E 5 S CE Bake Oven |
Blue M | DCC 1406 E 5 S CE | Bake Oven | - |
| 295 |
|
Blue M DCC 1406 E LRC Bake Oven |
Blue M | DCC 1406 E LRC | Bake Oven | - |
| 296 |
|
Blue M DCC 1406 E LRC Bake Oven |
Blue M | DCC 1406 E LRC | Bake Oven | - |
| 297 |
|
Blue M DCC 1406 E LRC Bake Oven |
Blue M | DCC 1406 E LRC | Bake Oven | - |
| 298 |
|
Blue M OV 475 A 3 Bake Oven |
Blue M | OV 475 A 3 | Bake Oven | - |
| 299 |
|
Applied Materials Axiom Decoupled Plasma Source (DPS) Dry Etcher Chamber |
Applied Materials | Axiom | Decoupled Plasma Source (DPS) Dry Etcher Chamber | 12 inch |
| 300 |
|
Applied Materials Axiom Decoupled Plasma Source (DPS) Dry Etcher Chamber |
Applied Materials | Axiom | Decoupled Plasma Source (DPS) Dry Etcher Chamber | 12 inch |
| 301 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 302 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 303 |
|
Lam Etch PR Strip Chamber |
Lam | - | Etch PR Strip Chamber | 8 inch |
| 304 |
|
Lam 2300 STAR Dry Etcher |
Lam | 2300 STAR | Dry Etcher | 8 inch |
| 305 |
|
Lam STAR (Chamber) Dry Etcher |
Lam | STAR (Chamber) | Dry Etcher | - |
| 306 |
|
Lam Extrima 3100 Dry Etcher |
Lam | Extrima 3100 | Dry Etcher | - |
| 307 |
|
Applied Materials Centura 5200 Etch EMxP+ |
Applied Materials | Centura 5200 Etch | EMxP+ | 8 inch |
| 463 |
|
Therma-wave OP 2600 OPTI Probe |
Therma-wave | OP 2600 | OPTI Probe | 8 inch |
| 464 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 465 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 466 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 467 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 468 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 469 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 470 |
|
Leica INS 3000 Wafer Defect Inspection |
Leica | INS 3000 | Wafer Defect Inspection | 8 inch |
| 471 |
|
LG Semicon CLS 9002 Optical Inspection Machine |
LG Semicon | CLS 9002 | Optical Inspection Machine | - |
| 472 |
|
Mosaid MS 4205 EX Bench Memory Tester |
Mosaid | MS 4205 | EX Bench Memory Tester | - |
| 473 |
|
Nanometrics 9-7200-0195 E Mask & Wafer Inspection |
Nanometrics | 9-7200-0195 E | Mask & Wafer Inspection | 8 inch |
| 474 |
|
Nanometrics Q 230 Overlay |
Nanometrics | Q 230 | Overlay | 8 inch |
| 475 |
|
Nanometrics Nanospec ATF Film Thickness Measurement |
Nanometrics | Nanospec ATF | Film Thickness Measurement | - |
| 476 |
|
Nanometrics Nanospec ATF 210 Film Thickness Measurement |
Nanometrics | Nanospec ATF 210 | Film Thickness Measurement | - |
| 477 |
|
Nikon 3 OPTI Station |
Nikon | 3 | OPTI Station | - |
| 478 |
|
Nikon 3 OPTI Station |
Nikon | 3 | OPTI Station | - |
| 479 |
|
Nikon 3A OPTI Station |
Nikon | 3A | OPTI Station | - |
| 480 |
|
SSM 5200 Resistivity |
SSM | 5200 | Resistivity | - |
| 481 |
|
Panasonic VP 7722 A Audio Analyzer |
Panasonic | VP 7722 A | Audio Analyzer | - |
| 482 |
|
Panasonic VP 7722 A Audio Analyzer |
Panasonic | VP 7722 A | Audio Analyzer | - |
| 483 |
|
Rigaku XRF 3630 Wafer / Disk Analyzer |
Rigaku | XRF 3630 | Wafer / Disk Analyzer | - |
| 484 |
|
Rigaku XRF 3630 Wafer/ Disk Analyzer |
Rigaku | XRF 3630 | Wafer/ Disk Analyzer | - |
| 485 |
|
Rigaku XRF 3630 Wafer/ Disk Analyzer |
Rigaku | XRF 3630 | Wafer/ Disk Analyzer | - |
| 486 |
|
Rigaku XRF 3640 Wafer/ Disk Analyzer |
Rigaku | XRF 3640 | Wafer/ Disk Analyzer | 8 inch |
| 487 |
|
Rigaku XRF 3640 Wafer/ Disk Analyzer |
Rigaku | XRF 3640 | Wafer/ Disk Analyzer | - |
| 488 |
|
Rudolph FE IV D |
Rudolph | FE IV D | - | - |
| 489 |
|
Rudolph Research / Auto 2, 4 A Automatic Ellipsometer |
Rudolph | Research / Auto 2, 4 A | Automatic Ellipsometer | 4 inch |
| 490 |
|
Rudolph Film Thickness Monitor |
Rudolph | - | Film Thickness Monitor | - |
| 491 |
|
Rudolph MetaPulse 200 Film Metrology |
Rudolph | MetaPulse 200 | Film Metrology | 8 inch |