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Equipment Selection to Meet Your Needs
Shop Thousands
of Semiconductor Manufacturing Solutions
56153 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 2755 |
|
KLA-Tencor 2139 Inspection System |
KLA-Tencor | 2139 | Inspection System | 8 inch |
| 2756 |
|
KLA-Tencor 5300 Overlay Measurement System |
KLA-Tencor | 5300 | Overlay Measurement System | 8 inch |
| 2757 |
|
KLA-Tencor 5300 Overlay Measurement System |
KLA-Tencor | 5300 | Overlay Measurement System | 8 inch |
| 2758 |
|
KLA-Tencor 5300 Overlay Measurement System |
KLA-Tencor | 5300 | Overlay Measurement System | 8 inch |
| 2759 |
|
KLA-Tencor 6200 Surface Analyzer |
KLA-Tencor | 6200 | Surface Analyzer | 8 inch |
| 2760 |
|
KLA-Tencor 6200 Surface Analyzer |
KLA-Tencor | 6200 | Surface Analyzer | 8 inch |
| 2761 |
|
KLA-Tencor 6420 Surface Analyzer |
KLA-Tencor | 6420 | Surface Analyzer | 8 inch |
| 2762 |
|
KLA-Tencor 6420 Surface Analyzer |
KLA-Tencor | 6420 | Surface Analyzer | 8 inch |
| 2763 |
|
KLA-Tencor 6420 Surface Analyzer |
KLA-Tencor | 6420 | Surface Analyzer | 8 inch |
| 2764 |
|
KLA-Tencor AIT II Inspection System |
KLA-Tencor | AIT II | Inspection System | 8 inch |
| 2765 |
|
KLA-Tencor AIT XP Inspection System |
KLA-Tencor | AIT XP | Inspection System | 8 inch |
| 2766 |
|
KLA-Tencor Aleris 8360 Thin Film Measurement System |
KLA-Tencor | Aleris 8360 | Thin Film Measurement System | 12 inch |
| 2767 |
|
KLA-Tencor Aleris 8350 Thin Film Measurement System |
KLA-Tencor | Aleris 8350 | Thin Film Measurement System | 12 inch |
| 2768 |
|
KLA-Tencor Archer 10 Overlay Measurement System |
KLA-Tencor | Archer 10 | Overlay Measurement System | 8 inch |
| 2769 |
|
KLA-Tencor eS 32 Inspection System |
KLA-Tencor | eS 32 | Inspection System | 12 inch |
| 2770 |
|
Kokusai VR 120 Resistivity Tester |
Kokusai | VR 120 | Resistivity Tester | 12 inch |
| 2771 |
|
Kokusai VR 120 Resistivity Tester |
Kokusai | VR 120 | Resistivity Tester | 12 inch |
| 2772 |
|
Kokusai VR 120 Resistivity Tester |
Kokusai | VR 120 | Resistivity Tester | 12 inch |
| 2773 |
|
K&S Maxum Ball Wire Bonder |
K&S | Maxum | Ball Wire Bonder | 6 inch |
| 2774 |
|
Kyowa Drop Master 700 D Surface Analyzer |
Kyowa | Drop Master 700 D | Surface Analyzer | 12 inch |
| 2775 |
|
Lam 2300 ELD A 1 Electroless Deposition |
Lam | 2300 ELD A 1 | Electroless Deposition | 12 inch |
| 2776 |
|
Lam 2300 Exelan Oxide Etcher |
Lam | 2300 Exelan | Oxide Etcher | 8 inch |
| 2777 |
|
Lam 2300 Exelan Flex Oxide Etcher |
Lam | 2300 Exelan Flex | Oxide Etcher | 8 inch |
| 2778 |
|
Lam 2300 Exelan Flex Oxide Etcher |
Lam | 2300 Exelan Flex | Oxide Etcher | 8 inch |
| 2779 |
|
Lam 2300 Exelan Flex Oxide Etcher |
Lam | 2300 Exelan Flex | Oxide Etcher | 8 inch |
| 2780 |
|
Lam 4600 series Metal Etcher |
Lam | 4600 series | Metal Etcher | 6 inch |
| 2781 |
|
Lam 9400 series Etcher |
Lam | 9400 series | Etcher | 8 inch |
| 2782 |
|
Lam 9600 series Metal Etcher |
Lam | 9600 series | Metal Etcher | 6 inch |
| 2783 |
|
Leica LDS 3300 M Inspection System |
Leica | LDS 3300 M | Inspection System | 12 inch |
| 2784 |
|
Leica LDS 3300 M Inspection System |
Leica | LDS 3300 M | Inspection System | 12 inch |
| 2785 |
|
Leo Instruments / Cambridge S 260 SEM |
Leo Instruments / Cambridge | S 260 | SEM | - |
| 2786 |
|
Mattson 2800 Epsilon Rapid Thermal Process (RTP) |
Mattson | 2800 Epsilon | Rapid Thermal Process (RTP) | 8 inch |
| 2787 |
|
Mattson 2800 Epsilon Rapid Thermal Process (RTP) |
Mattson | 2800 Epsilon | Rapid Thermal Process (RTP) | 8 inch |
| 2788 |
|
Mattson 2800 Epsilon Rapid Thermal Process (RTP) |
Mattson | 2800 Epsilon | Rapid Thermal Process (RTP) | 8 inch |
| 2789 |
|
Micro Instrument PE 9020 Electromigration Evaluation |
Micro Instrument | PE 9020 | Electromigration Evaluation | - |
| 2790 |
|
Micro Instrument PE 9020 Electromigration Evaluation |
Micro Instrument | PE 9020 | Electromigration Evaluation | - |
| 2791 |
|
MRC 600 Series PVD |
MRC | 600 Series | PVD | 6 inch |
| 2792 |
|
Nanometrics 210 AFT Thin Film Measurement System |
Nanometrics | 210 AFT | Thin Film Measurement System | 8 inch |
| 2793 |
|
Nanometrics 210 AFT Thin Film Measurement System |
Nanometrics | 210 AFT | Thin Film Measurement System | 8 inch |
| 2794 |
|
Nanometrics 210 XP AFT Thin Film Measurement System |
Nanometrics | 210 XP AFT | Thin Film Measurement System | 6 inch |
| 2795 |
|
Nanometrics Nanospec M 5100 Inspection System |
Nanometrics | Nanospec M 5100 | Inspection System | 8 inch |
| 2796 |
|
Nanometrics Nanospec M 5100 Inspection System |
Nanometrics | Nanospec M 5100 | Inspection System | 8 inch |
| 2797 |
|
Nikon AMI 2000 Surface Analyzer |
Nikon | AMI 2000 | Surface Analyzer | - |
| 2798 |
|
Nikon AMI 3000 Surface Analyzer |
Nikon | AMI 3000 | Surface Analyzer | 8 inch |
| 2799 |
|
Nikon AMI-3000 Surface Analyzer |
Nikon | AMI-3000 | Surface Analyzer | - |
| 2800 |
|
Nikon NSR 2205 EX 14 C Stepper |
Nikon | NSR 2205 EX 14 C | Stepper | 8 inch |
| 2801 |
|
Nikon NSR 2205 EX 14 C Stepper |
Nikon | NSR 2205 EX 14 C | Stepper | 8 inch |
| 2802 |
|
Nikon NSR 2205 i 12 D i-Line Stepper |
Nikon | NSR 2205 i 12 D | i-Line Stepper | 8 inch |