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of Semiconductor Manufacturing Solutions
56148 products
| Asset # | Image | Title | Make | Model | Type | Wafer Size |
|---|---|---|---|---|---|---|
| 82359 |
|
Nikon N SIS 5 Light Source |
Nikon | N SIS 5 | Light Source | - |
| 82360 |
|
Nikon N SIS 5 Light Source |
Nikon | N SIS 5 | Light Source | - |
| 82361 |
|
Nikon N SIS 5 Light Source |
Nikon | N SIS 5 | Light Source | - |
| 82364 |
|
Applied Materials Producer S TEOS CVD |
Applied Materials | Producer S | TEOS CVD | - |
| 82365 |
|
Multitest MT 9928 Handler |
Multitest | MT 9928 | Handler | - |
| 82366 |
|
Applied Materials Quantum Leap II Low Energy Implanter |
Applied Materials | Quantum Leap II | Low Energy Implanter | 8 inch |
| 82367 |
|
Applied Materials SEMVision G 3 Lite DR-SEM |
Applied Materials | SEMVision G 3 Lite | DR-SEM | - |
| 82368 |
|
ASM AD 830 Die Bonder |
ASM | AD 830 | Die Bonder | 4 inch |
| 82369 |
|
ASM AD 830 + Die Bonder |
ASM | AD 830 + | Die Bonder | 4 inch |
| 82370 |
|
ASM Dragon 2300 PECVD |
ASM | Dragon 2300 | PECVD | - |
| 82371 |
|
Rudolph NSX 105 Inspection System |
Rudolph | NSX 105 | Inspection System | 8 inch |
| 82372 |
|
Rudolph NSX 105 Inspection System |
Rudolph | NSX 105 | Inspection System | 8 inch |
| 82373 |
|
Rudolph NSX 105 Inspection System |
Rudolph | NSX 105 | Inspection System | - |
| 82374 |
|
Rudolph NSX 105 Inspection System |
Rudolph | NSX 105 | Inspection System | 8 inch |
| 82375 |
|
Rudolph AXI S Macro Inspection |
Rudolph | AXI S | Macro Inspection | - |
| 82376 |
|
Rudolph AXI S Macro Inspection |
Rudolph | AXI S | Macro Inspection | - |
| 82377 |
|
Rudolph 3 DI 8500 Macro Inspection |
Rudolph | 3 DI 8500 | Macro Inspection | - |
| 82378 |
|
Olympus MX 61 L F Microscope |
Olympus | MX 61 L F | Microscope | - |
| 82379 |
|
Olympus MX 61 L F Microscope |
Olympus | MX 61 L F | Microscope | - |
| 82380 |
|
Seiko / Epson NS 6040 Handler |
Seiko / Epson | NS 6040 | Handler | - |