FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Sold

Asset # : 57737
Equipment Make: FEI
Equipment Model: Strata 235
Type: Dual Beam FIB-SEM
Wafer Size:
Equipment Configuration:

– 230V, 50/60Hz
– IS II-E gas injection system
– Bruker 610M XFlash detector
– 18572-H AVA controller
– 18572-K AVA controller
– Delta Elektronika SM7020-D power supply
– XEI Evactron E50 remote plasma cleaner
Includes:
– Pelco video monitor
– Leader LBO
Equipment Pictures:
Buy FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) 57737

FEI Strata Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) For Sale

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FEI Strata Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Refurbished

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FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope For Sale Online

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FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) 57737

FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Image 1

FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Image 2

FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Image 3

FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Image 4

FEI Strata 235 Dual Beam Focused Ion Beam Scanning Electron Microscope (FIB/SEM) Image 5

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  • Added: November 10, 2020

  • Views: 510

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