FEI DB 235 Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) Sold

Asset # : 52448
Equipment Make: FEI
Equipment Model: DB 235
Type: FIB-SEM
Wafer Size:
Equipment Configuration:

– Sirion FEG electron column (500V-30KV).
– FEG tip changed January, 2019.
– Magnum Ga+ ion column (10KV, 30KV).
– 5-axis tilt-eucentric 50mm x 50mm motorized stage.
– Windows 2000 computer with FEI xP 3.35 DualBeam System Software.
– Desktop console
– Th
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  • Added: October 9, 2020

  • Views: 905

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