Jeol JSM 6510 LA Scanning Electron Microscope (SEM) Sold

Asset # : 24324
Equipment Make: Jeol
Equipment Model: JSM 6510 LA
Type: SEM
Wafer Size:
Equipment Configuration:

– Resolution: High Vacuum Mode 3.0 nm(30 kV), 8 nm(3 kV), 15 nm(1 kV)
Low Vacuum Mode 4.0 nm (30kV)
– Magnification: x5 ~x 300,000 (at Image Size 128 mm x 96 mm)
– EDS: JED-2300 Analysis Station Plus
– Chiller
– Operation Manual
– PC OS Windows Vis

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  • Added: July 1, 2019

  • Views: 770

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