Jeol JSM 6510 LA Scanning Electron Microscope (SEM) Sold

– Resolution: High Vacuum Mode 3.0 nm(30 kV), 8 nm(3 kV), 15 nm(1 kV)
Low Vacuum Mode 4.0 nm (30kV)
– Magnification: x5 ~x 300,000 (at Image Size 128 mm x 96 mm)
– EDS: JED-2300 Analysis Station Plus
– Chiller
– Operation Manual
– PC OS Windows Vis